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Complementary methods of transverse emittance measurement
Authors:
Zagel, James
Hu, Martin
Jansson, Andreas
Thurman-Keup, Randy
Yan, Ming-Jen
/Fermilab
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| Abstract: Several complementary transverse emittance monitors have been developed and used at the Fermilab accelerator complex. These include Ionization profile Monitors (IPM), Flying Wires, Schottky detectors and a Synchrotron Light Monitor (Synchlite). Mechanical scrapers have also been used for calibration purposes. This paper describes the various measurement devices by examining their basic features, calibration requirements, systematic uncertainties, and applications to collider operation. A comparison of results from different kinds of measurements is also presented. |
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| Publication Date: |
01 May 2008
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| Report numbers: |
FERMILAB-CONF-08-114-AD
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| DOE Contract number: |
AC02-76CH03000
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| Resource Type: |
Conference
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| Resource Relation: |
Conference: Presented at 13th Beam Instrumentation Workshop (BIW08), Lake Tahoe, California, 4-8 May 2008
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| Research Organizations: |
Fermi National Accelerator Laboratory (FNAL), Batavia, IL
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| Sponsoring Organizations: |
USDOE
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| Country of Publication: |
United States
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| Language: |
English
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Keywords relating to this report: 
